Course details ... Course content ... Registration form
One-day
Course on Circuit Marginalities Dealing with VLSI Design
and Circuit Marginalities during Test
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Organized
by
VLSI
Society of India |
Event Report Event photographs Overview: An increasing number of chip failures are caused by circuit marginalities. Circuit marginality encompasses failures due to unsafe design approximations, process variations, and failure to account for some electrical and thermal properties of a chip. In this tutorial, we will describe physical causes, modeling approaches for pattern generation and general discussion on avoidance techniques. The tutorial is targeted to practicing Engineers, Students and University Faculty. Course content provided below. |
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In cooperation with
![]() IEEE TTTC Kolkata Chapter |
Course conducted by: Sandip Kundu, University of Massachusetts,
USA Sandip
Kundu is a Professor of Electrical and Computer
Engineering at University of Massachusetts, Amherst. Previously, he was a
Principal Engineer at Intel and Research Staff Member at IBM Yorktown. He has
published more than 70 papers in diverse areas including VLSI design,
Testing, CAD and Coding & Information Theory. Sandip holds several US patents. He has given
more than 10 tutorials at international conferences such as the VLSI Test
Symposium, International Test Conference, DATE, and others. His major
accomplishments include Intel ultra-drowsy technology (US Patent 6,715,091),
mixed synchronous and asynchronous circuit simulation technology used at
Intel (US patent 6,973,422), commercial CAD software called GateMakerTM (sole
author) that is marketed by Cadence after its acquisition from IBM and
t-SyEC/AUED codes used in optical communications. He
was the Technical Program Chair of ICCD in 2000 and General Chair in 2001. He
served as a General Chair of the International Conference on VLSI Design,
2005. Prof. Kundu is currently an associate editor of IEEE Transactions on
Computers. |
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