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Presenters:
Nilanjan Mukherjee
received a B.Tech. (Hons) degree in Electronics and Electrical
Communications Engineering from IIT Kharagpur, India, and a Ph.D.
degree in Computer Engineering from McGill University, Montreal,
Canada. He has been with Mentor Graphics since 1999 and is currently
leading the Test Synthesis Group within the DFT division. He is a
co-inventor of the Embedded Deterministic Test Technology and was a
lead developer for TestKompress, the leading test compression tool
in the industry. Prior to Mentor, he was with Bell Laboratories at
Lucent Technologies.
Nilanjan has published over 35
technical papers at various international conferences and refereed
journals. He received the Best Paper Award at the VLSI Test
Symposium in 1995 and co-authored a paper that received the Best
Student Paper award at the 2001 Asian Test Symposium. Nilanjan is a
co-inventor of 20 US patents, some of which are pending approval.
Professor
Sudhakar M. Reddy
received the B.Sc. degree in Physics and the B.E. degree in
Electronic Communications Engineering (ECE) from Osmania University,
Hyderabad, the M.E. degree in ECE from the Indian Institute of
Science, Bangalore, India, and the Ph.D. degree from the University
of Iowa, Iowa City, Iowa. He joined the faculty of the Department of
Electrical and Computer Engineering at the University of Iowa in
1968 where he is currently a University of Iowa Foundation
Distinguished Professor of ECE. He served as the Chairperson of the
ECE Department from 1981 to 2000.
Professor Reddy
has published well over four hundred papers in archival journals and
the proceedings of international conferences. Several papers
co-authored by him received best paper nominations and awards.
Professor Reddy has given keynote talks at international
conferences. He has also given one-day tutorials to practicing
engineers at international conferences. He received a Von Humboldt
Prize in 1995 and the first Life Time Achievement Award from the
International Conference on VLSI Design. Professor Reddy is a Life
Fellow of IEEE.
Professor Reddy
has served on the committees of several international conferences.
He was the Technical Program Committee Chair of the 1989 Fault
Tolerant Computing Symposium. He has served twice as a guest editor
for the special issues on Fault Tolerant Computing and as an
associate editor of the IEEE Transactions on Computers and has been
serving as an associate editor of the IEEE Transactions on CAD for
the last ten years. |
