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2nd VLSI Design And Test Workshops
August 6-7, 1998 |
Index Search for paper details and abstracts ![]() | |
TestM-Testable Arithmetic Iterative ArraysM. Jamoussi, KFUPM
Automated Synthesis of Large Phase Shifters for BIST.
On Connectivity and Inversion Problems in Scan Chains.
DEST: A Method for Multiple Stuck-at and Delay Fault Detection in Combinational Circuits
Methodology for Static Verification of Multi-Million Gate Designs
Multiple Signature Testing for Path Delay Faults
Integrated Test Vector Flow for Design QC
Test Vector Language Parser Enabling Language-Independent Test Flow
Designing a Testable IIR Filter Core Logic DesignDesign of Digital FIR Filters for Low Power ApplicationsAshima Malhotra, Duet Technology and C.P. Ravikumar, IIT Delhi
Parameterized Divider Cells for Datapath Synthesis
Standard Cell based and FPGA based ASIC design of CORDIC Core
Hardware Software Partition Using Genetic Algorithms and Application to MPEG Encoder and Echo Cancellation
Integrated Scheduling and Allocation for Synthesis of Structured Data Paths
Constraint Programming Applied to High-Level Synthesis and System-Level Synthesis of Application-Specific Systems
Modelling and Performance Analysis of Buffered Leaky Bucket Policing for ATM Networks using VHDL
Development of a large scale System Partitioner
System Partitioning and Technology Selection
VLSI Design Flow Management
Hardware-Software Cosynthesis of a Multiprocessor System for Real-time Applications
VLSI Design Experience at Kurukshetra University Physical DesignA Fast Algorithm for Transistor FoldingEdward Y.C. Cheng and Sartaj Sahni, University of Florida
Wire Length Minimization in Multi-layer Channel Routing
Crosstalk Minimization through Transistor Sizing
Fast Circuit Extraction from MOS Switch-level Descriptions
Effective Capacitance Seen by Timing Arcs in a Cell
Topological Routing in the Presence of Polygonal Obstacles
Dielectric Based Electrostatic Microactuators.
CMOS to TTL interfaces in high performance VLSI circuits
Placement Algorithm for Low Power
VLSI Chips on 3-D Closed Surfaces.
Reliability Problems in Deep Submicron ICs
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