VLSI Design and Test Workshops
August
20-21, 1999
New
Delhi, India.
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Santau Chattopadhyay et. al., IIT Kharagpur.
Test Sequence Generation with Cellular Automata.
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Amit Premy, Texas Instruments, India.
Test Simulation Flow for Mixed Signal ICs.
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M.C. Bhuvaneshwari.
Testing of Asynchronous Circuits.
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T. Ramesh, Philips Semiconductors, Bangalore, India.
Design for Testability Issues in VLSI Chip Design.
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Rubin Parekhji, Texas Instruments, Bangalore, India.
Techniques for obtaining higher fault coverage.
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Srikanth Balasubramanian, Philips Semiconductors, Bangalore, India.
Testing Memory Designs.
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V.C. Prasad, IIT Delhi.
Tutorial on Analog Testing. (Invited)
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Ranga Vemuri, University of Cincinnati.
Tutorial on Verification of Synthesized RTL Designs. (Invited)
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Apurva Kalia, Cadence Design Systems, Noida, India.
Tutorial on Verification of VLSI Systems. (Invited)
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Gaurav Chandra, Ashutosh Verma, C.P. Ravikumar, IIT Delhi.
Power-constrained Optimization of Test Plans.
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Prabir Dasgupta et al., IIT Kharagpur.
Recursive Pseudoexhaustive Test Pattern Generation with Cellular Automata.
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R. Parekhji, Texas Instruments, Bangalore, India.
Issues in Testing Core-based Systems.
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Anand Hardi, Anil Kalra , Balwant Singh , Santosh and Shamsi Azmi, ST Microelectronics.
On-chip characterization and Debugging methodology for high-speed embedded memories.
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Rubin Parekhji, Texas Instruments (India) Ltd.
Emulation as a verification tool.
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Prabir Dasgupta, Santanu Chattopadhyay, and Indranil Sengupta, IIT Kharagpur.
Recursive Pseudoexhaustive Test Pattern Generation with Cellular Automata.
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Susheel Sinha, Texas Instruments, Bangalore, india.
Managing VLSI Design Complexity: Lessons from Software Experience. (Invited Talk)
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Vineet Sahula, IIT Delhi.
Extended Signal Flow Graph Model for VLSI Design Processes.
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V. Srisha and Saif Khan, Philips Semiconductors, Bangalore, India.
System-level VLSI Design Experiences.
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Hemendra Godbole, Synopsys, USA.
Tutorial on Timing Closure in System on Chip Designs. (Invited)
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B. Suresh and R. Harinath, Texas Instruments (India) Ltd.
RTL Design of a Small Memory.
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R. Varambally and Christophe Frey, ST Microelectronics.
Design and Results of a Hierarchical Megabit SRAM Compiler.
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G. Sreenivas, Cypress Semiconductors.
Power-constrained Testing of Embedded SRAMs.
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Mahesh Mehendale, Texas Instruments (India) Ltd.
A Methodology for Exploring Area-Delay-Power Space for DSP
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Amitabh Menon, Texas Instruments (India) Ltd.
Low Power Microarchitectures for Programmable DSPs.
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S.D. Sherlekar, Silicon Automation Systems.
System Level Considerations in Realizing Low Power DSP Applications.
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Rohit Sharma, Texas Instruments (India) Ltd.
Area-Efficient Digital Waveform Generators.
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Anil K. Gundurao and Kaushal, Cypress Semiconductors.
Clock Generator Chip: Architecture/Design Issues.
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Pradeep Mandal, Philips Semiconductors, Bangalore, India.
I/O Pad Design.
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S. Sahni. University of Florida.
Efficient Algorithm for the Channel Inversion Problem.
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Parthasarathi DasGupta, Indian Statistical Institute.
Complex Triangle Elimination Problem and its Applications to VLSI.
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Dinesh Bhatia, University of Cincinnati.
Layout Algorithms for FPGA.
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S. Sankara Subramanian, ATI Tech, G. Rajagopalan, Analog Devices, and C.P. Ravikumar, IIT Delhi.
Crosstalk Estimation in VLSI Circuits.
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Rubin Parekhji, Texas Instruments (India) Ltd.
Tutorial on Applications of Graph Theory to VLSI Design Problems. (Invited)
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Dinesh Bhatia, University of Cincinnati.
Tutorial on FPGA Layout. (Invited)
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Ganesh Kamath and Preetham Kumar, Texas Instruments (India) Ltd.
A Physical Layout Efficiency Checker with an Emhpasis on Die Area Reduction.
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Rupesh S. Shelar, Silicon Automation Systems, Madhav Desai and H. Narayanan, IIT Bombay.
Decomposition of Finite State Machines for Area, Delay Minimization.
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Shampa Chakraverty, Netaji Subhash Institute of Technology.
Estimating the Deadline Miss Probability in Real Time Embedded Systems.
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Sabyasachi Nag and Ananth Somayaji, Texas Instruments (India) Ltd.
An approach towards Hierarchical Detection of ESD Errors in a Physical Layout.
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C. Rajkumar and Sanjay Kulkarni, Texas Instruments (India) Ltd.
An Effective Methodology to Extract Parasitic from Layout.