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EVENTS 2005 - PRESENT

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    3-Day Intensive Course on Design for Testability - Theory and Practice
December 15-17, 2005 IIT Delhi, New Delhi
Organized by:VLSI Society of India
In co-operation with: IEEE Circuits and Systems Society
Presenters:
Dr.Vishwani D. Agrawal, James J. Danaher Professor, Auburn University, USA
Dr.C.P. Ravikumar, Texas Instruments, India